Technological Viewpoints: Historical Technology, Materials and Conservation: sem and Microanalysis
DOI:
https://doi.org/10.30763/Intervencion.2013.8.101Keywords:
Historical technology, SEM, microanalysisAbstract
Review of the book Historical Technology, Materials
and Conservation: sem and Microanalysis edited by Nigel
Meeks, Caroline Cartwright, Andrew Meek and Aude
Mongiatti, printed by Archetype Publications in association
with the British Museum, London in 2012. This book
contains written versions of the presentations given at the
two-day conference entitled “SEM and Microanalysis in
the Study of Historical Technology, Materials and Conservation” held at the British Museum on 9-10 September
2010, organized by the Department of Conservation and
Scientific Research of the British Museum, in association
with Hitachi High-Technology Europe.
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References
Allen, Sarah, Jenny Hodgson, David Dungworth y Sarah Paynter
“The Bedford Lemere collection: investigating degradation glass plate negatives”, en Meeks, Cartwright,
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Burnstock, Aviva, Alexander D. Ball, Lauren E. Howard y Genevieve Silvester
“A pilot application of scanning electron microscopy and high-resolution X- radiography for the conservation
of paintings”, en Meeks, Cartwright, Meek y Mongiatti (eds.) 2012:14-20.
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“Alcances de la técnica de fluorescencia de rayos X (frx) aplicada al estudio de la distribución estratigráfica
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